Overview

MBIST is a self-testing and repair mechanism which tests the memories through an effective set of algorithms to detect possibly all the faults that could be present inside a typical memory cell whether it is stuck-at (SAF), transition delay faults (TDF), coupling (CF) or neighborhood pattern sensitive faults (NPSF). This project uses only open source tool set for simulation,synthesis and backend tools. The SOC flow follow the openlane methodology and SOC environment is compatible with efabless/carvel methodology.

MBIST Block Diagram

Key features

    * Open sourced under Apache-2.0 License (see LICENSE file) - unrestricted commercial use allowed.
    * Mbist controller with memory repair supported
    * Currently only Row Redudency is supported
    * 2KB SRAM for data memory
    * Wishbone compatible design
    * Written in System Verilog
    * Open-source tool set
       * simulation - iverilog
       * synthesis  - yosys
       * backend/sta - openlane tool set
    * Verification suite provided.